Reconstruction of an InAs nanowire using geometric tomography

Robert S. Pennington; Stefan König; Andreas Alpers; Chris Boothroyd; Rafal E. Dunin-Borkowski

Reconstruction of an InAs nanowire using geometric tomography

Robert S. Pennington, Stefan König, Andreas Alpers, Chris Boothroyd, Rafal E. Dunin-Borkowski

Technical University of Munich

Research output: Contribution to conference › Poster › Research

Abstract

Geometric tomography and conventional algebraic tomography algorithms are used to reconstruct cross-sections of an InAs nanowire from a tilt series of experimental annular dark-field images. Both algorithms are also applied to a test object to assess what factors affect the reconstruction quality. When using the present algorithms, geometric tomography is faster, but artifacts in the reconstruction may be difficult to recognize.

Original language	English
Publication date	2011
Publication status	Published - 2011
Event	Microscopy of Semiconducting Materials - Cambridge, United Kingdom Duration: 1 Jan 2011 → … Conference number: 17

Conference

Conference	Microscopy of Semiconducting Materials
Number	17
City	Cambridge, United Kingdom
Period	01/01/2011 → …

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title = "Reconstruction of an InAs nanowire using geometric tomography",

abstract = "Geometric tomography and conventional algebraic tomography algorithms are used to reconstruct cross-sections of an InAs nanowire from a tilt series of experimental annular dark-field images. Both algorithms are also applied to a test object to assess what factors affect the reconstruction quality. When using the present algorithms, geometric tomography is faster, but artifacts in the reconstruction may be difficult to recognize.",

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T1 - Reconstruction of an InAs nanowire using geometric tomography

AU - Pennington, Robert S.

AU - König, Stefan

AU - Alpers, Andreas

AU - Boothroyd, Chris

AU - Dunin-Borkowski, Rafal E.

N1 - Conference code: 17

PY - 2011

Y1 - 2011

N2 - Geometric tomography and conventional algebraic tomography algorithms are used to reconstruct cross-sections of an InAs nanowire from a tilt series of experimental annular dark-field images. Both algorithms are also applied to a test object to assess what factors affect the reconstruction quality. When using the present algorithms, geometric tomography is faster, but artifacts in the reconstruction may be difficult to recognize.

AB - Geometric tomography and conventional algebraic tomography algorithms are used to reconstruct cross-sections of an InAs nanowire from a tilt series of experimental annular dark-field images. Both algorithms are also applied to a test object to assess what factors affect the reconstruction quality. When using the present algorithms, geometric tomography is faster, but artifacts in the reconstruction may be difficult to recognize.

M3 - Poster

T2 - Microscopy of Semiconducting Materials

Y2 - 1 January 2011

ER -

Reconstruction of an InAs nanowire using geometric tomography

Abstract

Conference

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