Abstract
Geometric tomography and conventional algebraic tomography algorithms are used to reconstruct cross-sections of an InAs nanowire from a tilt series of experimental annular dark-field images. Both algorithms are also applied to a test object to assess what factors affect the reconstruction quality. When using the present algorithms, geometric tomography is faster, but artifacts in the reconstruction may be difficult to recognize.
| Original language | English |
|---|---|
| Book series | Journal of Physics: Conference Series |
| Volume | 326 |
| Issue number | 1 |
| Pages (from-to) | 012045 |
| ISSN | 1742-6588 |
| DOIs | |
| Publication status | Published - 2011 |
| Event | 17th International Conference on Microscopy of Semiconducting Materials - University of Cambridge, Cambridge, United Kingdom Duration: 4 Apr 2011 → 7 Apr 2011 Conference number: 17 |
Conference
| Conference | 17th International Conference on Microscopy of Semiconducting Materials |
|---|---|
| Number | 17 |
| Location | University of Cambridge |
| Country/Territory | United Kingdom |
| City | Cambridge |
| Period | 04/04/2011 → 07/04/2011 |
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