Reconstruction of an InAs nanowire using geometric and algebraic tomography

Robert S. Pennington; S. König; A. Alpers; Chris Boothroyd; Rafal E. Dunin-Borkowski

doi:10.1088/1742-6596/326/1/012045

Reconstruction of an InAs nanowire using geometric and algebraic tomography

Robert S. Pennington, S. König, A. Alpers, Chris Boothroyd, Rafal E. Dunin-Borkowski

Technical University of Munich

Research output: Contribution to journal › Conference article › Research › peer-review

Abstract

Geometric tomography and conventional algebraic tomography algorithms are used to reconstruct cross-sections of an InAs nanowire from a tilt series of experimental annular dark-field images. Both algorithms are also applied to a test object to assess what factors affect the reconstruction quality. When using the present algorithms, geometric tomography is faster, but artifacts in the reconstruction may be difficult to recognize.

Original language	English
Book series	Journal of Physics: Conference Series
Volume	326
Issue number	1
Pages (from-to)	012045
ISSN	1742-6588
DOIs	https://doi.org/10.1088/1742-6596/326/1/012045
Publication status	Published - 2011
Event	17th International Conference on Microscopy of Semiconducting Materials - University of Cambridge, Cambridge, United Kingdom Duration: 4 Apr 2011 → 7 Apr 2011 Conference number: 17

Conference

Conference	17th International Conference on Microscopy of Semiconducting Materials
Number	17
Location	University of Cambridge
Country/Territory	United Kingdom
City	Cambridge
Period	04/04/2011 → 07/04/2011

Access to Document

10.1088/1742-6596/326/1/012045

OpenUrl availability

Full text

Cite this

@inproceedings{d04bd71005f14fcf8414b9f7bd0fbb6d,

title = "Reconstruction of an InAs nanowire using geometric and algebraic tomography",

abstract = "Geometric tomography and conventional algebraic tomography algorithms are used to reconstruct cross-sections of an InAs nanowire from a tilt series of experimental annular dark-field images. Both algorithms are also applied to a test object to assess what factors affect the reconstruction quality. When using the present algorithms, geometric tomography is faster, but artifacts in the reconstruction may be difficult to recognize.",

author = "Pennington, {Robert S.} and S. K{\"o}nig and A. Alpers and Chris Boothroyd and Dunin-Borkowski, {Rafal E.}",

year = "2011",

doi = "10.1088/1742-6596/326/1/012045",

language = "English",

volume = "326",

pages = "012045",

journal = "Journal of Physics: Conference Series",

issn = "1742-6588",

publisher = "IOP Publishing",

number = "1",

note = "17th International Conference on Microscopy of Semiconducting Materials ; Conference date: 04-04-2011 Through 07-04-2011",

}

TY - GEN

T1 - Reconstruction of an InAs nanowire using geometric and algebraic tomography

AU - Pennington, Robert S.

AU - König, S.

AU - Alpers, A.

AU - Boothroyd, Chris

AU - Dunin-Borkowski, Rafal E.

N1 - Conference code: 17

PY - 2011

Y1 - 2011

N2 - Geometric tomography and conventional algebraic tomography algorithms are used to reconstruct cross-sections of an InAs nanowire from a tilt series of experimental annular dark-field images. Both algorithms are also applied to a test object to assess what factors affect the reconstruction quality. When using the present algorithms, geometric tomography is faster, but artifacts in the reconstruction may be difficult to recognize.

AB - Geometric tomography and conventional algebraic tomography algorithms are used to reconstruct cross-sections of an InAs nanowire from a tilt series of experimental annular dark-field images. Both algorithms are also applied to a test object to assess what factors affect the reconstruction quality. When using the present algorithms, geometric tomography is faster, but artifacts in the reconstruction may be difficult to recognize.

U2 - 10.1088/1742-6596/326/1/012045

DO - 10.1088/1742-6596/326/1/012045

M3 - Conference article

SN - 1742-6588

VL - 326

SP - 012045

JO - Journal of Physics: Conference Series

JF - Journal of Physics: Conference Series

IS - 1

T2 - 17th International Conference on Microscopy of Semiconducting Materials

Y2 - 4 April 2011 through 7 April 2011

ER -

Reconstruction of an InAs nanowire using geometric and algebraic tomography

Abstract

Conference

Access to Document

OpenUrl availability

Fingerprint

Cite this