Reciprocal space mapping and strain scanning using X-ray diffraction microscopy

H. F. Poulsen*, P. K. Cook, H. Leemreize, A. F. Pedersen, C. Yildirim, M. Kutsal, A. C. Jakobsen, J. X. Trujillo, J. Ormstrup, C. Detlefs

*Corresponding author for this work

Research output: Contribution to journal › Journal article › Research › peer-review

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