Abstract
This paper discusses general approaches and results
of real-time hardware-in-the-loop (HIL) testing for power
electronics controllers. Many different types of power electronic
controllers can be tested by connecting them to a real-time digital
simulator (RTDS) for closed-loop HIL testing. In this paper, two
HIL digital controller tests are presented as application examples
of the low-level signal interface in the closed-loop tests of power
electronic controllers. In the HIL tests, the power system and the
power electronics hardware are modeled in the RTDS. The
required control functions of the power electronics hardware are
not included in the RTDS. Instead, the control algorithms are
coded using the native C code and downloaded to the dedicated
digital signal processor (DSP)/microcontrollers. The two
experimental applications illustrate the effectiveness of the HIL
controller testing. Results of the HIL tests and hardware
validations are presented to illustrate the real-time HIL testing
method for power electronics controllers.
| Original language | English |
|---|---|
| Title of host publication | 2012 IEEE PES Asia-Pacific Power and Energy Engineering Conference |
| Publisher | IEEE |
| Publication date | 2012 |
| ISBN (Print) | 978-1-4577-0546-5 |
| DOIs | |
| Publication status | Published - 2012 |
| Event | 2012 IEEE PES Asia-Pacific Power and Energy Engineering Conference - Shanghai, China Duration: 27 Mar 2012 → 29 Mar 2012 https://ieeexplore.ieee.org/xpl/conhome/6304951/proceeding |
Conference
| Conference | 2012 IEEE PES Asia-Pacific Power and Energy Engineering Conference |
|---|---|
| Country/Territory | China |
| City | Shanghai |
| Period | 27/03/2012 → 29/03/2012 |
| Internet address |
Keywords
- Hardware-in-the-loop (HIL)
- Power electronics controllers
- Digital signal processor (DSP)
- Real time digital simulator (RTDS)