Raman scattering and x-ray diffraction studies of polycrystalline CaCu3Ti4O12 under high-pressure

D. Valim, A. G. S. Filho, P. T. C. Freire, S. B. Fagan, A. P. Ayala, J. M. Filho, A. F. L. Almeida, P. B. A. Fechine, A. S. B. Sombra, J. S. Olsen, Leif Gerward

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Abstract

We report Raman scattering and x-ray diffraction studies of polycrystalline CaCu3Ti4O12 (CCTO) under high pressures. The pressure dependence of several Raman modes was investigated. No anomalies have been observed on the phonon spectra thereby indicating that the T-h (Im (3) over bar) structure remains stable up to the maximum pressure (5.3 GPa) we reached in this experiment. The pressure coefficients for the observed Raman modes were determined. This set of parameters was used for evaluating the stress developed in CCTO thin films. The high-pressure x-ray studies were extended up to 46 GPa and the data confirmed that the T-h structure remains stable up to this pressure. The pressure-volume data are well described by the Birch's equation of state. The experimental value of the zero pressure bulk modulus is B-0=212+/-2 GPa. Gruneisen parameters of CCTO were also determined.
Original languageEnglish
JournalPhysical Review B Condensed Matter
Volume70
Issue number13
Pages (from-to)132103
ISSN0163-1829
DOIs
Publication statusPublished - 2004

Bibliographical note

Copyright (2004) American Physical Society.

Keywords

  • OXIDE
  • OPTICAL-PROPERTIES
  • THIN-FILMS
  • 001 LAALO3
  • HIGH-DIELECTRIC-CONSTANT
  • PULSED-LASER DEPOSITION

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