Abstract
We have numerically investigated the behavior of stacks of long Josephson junctions considering a nonuniform bias profile. In the presence of a microwave field the nonuniform bias, which favors the formation of fluxons, can give rise to a change of the sequence of radio-frequency induced steps. The amplitude of the steps is enhanced when the external frequency matches the fluxon shuttling regime.
| Original language | English |
|---|---|
| Journal | Journal of Applied Physics |
| Volume | 85 |
| Issue number | 9 |
| Pages (from-to) | 6904-6906 |
| ISSN | 0021-8979 |
| DOIs | |
| Publication status | Published - 1999 |