Quantitative TEM analysis of AI/Cu multilayer prepared by pulsed laser deposition

Research output: Contribution to conferencePosterResearchpeer-review

Original languageEnglish
Publication date2009
Publication statusPublished - 2009
Event10th International Conference on Laser Ablation - Singapore, Singapore
Duration: 22 Nov 200927 Nov 2009
Conference number: 10

Conference

Conference10th International Conference on Laser Ablation
Number10
CountrySingapore
CitySingapore
Period22/11/200927/11/2009

Keywords

  • Materials characterization and modelling
  • Materials research

Cite this

Liu, H., Pryds, N., Schou, J., & Huang, X. (2009). Quantitative TEM analysis of AI/Cu multilayer prepared by pulsed laser deposition. Poster session presented at 10th International Conference on Laser Ablation, Singapore, Singapore.