Quantitative methods for the analysis of electron microscope images

Peter Ulrik Vallø Skands

    Research output: Book/ReportPh.D. thesis

    Abstract

    The topic of this thesis is an general introduction to quantitative methods for the analysis of digital microscope images. The images presented are primarily been acquired from Scanning Electron Microscopes (SEM) and interfermeter microscopes (IFM). The topic is approached though several examples in a number work cases. These mainly falls in the three categories: (i) Description of coarse scale measures to quantify surface structure or texture (topography); (ii) Characterization of fracture surfaces in steels (fractography); (iii) Grain boundary segmentation in sintered ceramics. The theoretical foundation of the thesis fall in the areas of: 1) Mathematical Morphology; 2) Distance transforms and applications; and 3) Fractal geometry. Image analysis opens in general the possibility of a quantitative and statistical well founded measurement of digital microscope images. Herein lies also the conditions to correlate the micro-structure of materials to macroscopic properties, such as tensile strength, durability, chemical resistance.
    Original languageEnglish
    Place of PublicationKgs. Lyngby
    PublisherTechnical University of Denmark
    Number of pages198
    Publication statusPublished - 1996
    SeriesIMM-PHD-1996-24

    Bibliographical note

    ISSN 0909-3192

    Projects

    Cite this

    Skands, P. U. V. (1996). Quantitative methods for the analysis of electron microscope images. Technical University of Denmark. IMM-PHD-1996-24