Projects per year
Abstract
A method for the extension of the three-dimensional X-ray diffraction
technique to allow the extraction of domain volume fractions in polycrystalline
ferroic materials is presented. This method gives access to quantitative domain
volume fractions of hundreds of independent embedded grains within a bulk
sample. Such information is critical to furthering our understanding of the grainscale interactions of ferroic domains and their influence on bulk properties. The method also provides a validation tool for mesoscopic ferroic domain modelling efforts. The mathematical formulations presented here are applied to tetragonal coarse-grained Ba0.88Ca0.12Zr0.06Ti0.94O3 and rhombohedral fine-grained (0.82)Bi0.5Na0.5TiO3–(0.18)Bi0.5K0.5TiO3 electroceramic materials. The fitted volume fraction information is used to calculate grain-scale non-180° ferroelectric domain switching strains. The absolute errors are found to be approximately 0.01 and 0.03% for the tetragonal and rhombohedral cases,
which had maximum theoretical domain switching strains of 0.47 and 0.54%,
respectively. Limitations and possible extensions of the technique are discussed.
Original language | English |
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Journal | Journal of Applied Crystallography |
Volume | 48 |
Pages (from-to) | 882-889 |
ISSN | 0021-8898 |
DOIs | |
Publication status | Published - 2015 |
Keywords
- Ferroic materials
- Domain volume fractions
- Grain-scale strain
- Three-dimensional X-ray diffraction
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Dive into the research topics of 'Quantitative grain-scale ferroic domain volume fractions and domain switching strains from three-dimensional X-ray diffraction data'. Together they form a unique fingerprint.Projects
- 1 Finished
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FTP-PIEZO Multi-scale mapping of strain mechanisms in lead-free piezoceramics
Oddershede, J. (Project Participant), Schmidt, S. (Project Participant) & Majkut, M. (PhD Student)
01/01/2013 → 14/03/2016
Project: Research
Activities
- 1 Conference presentations
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Quantitative grain-scale ferroelectric domain volume fractions and domain switching strains measured by 3DXRD during in situ electrical poling
Oddershede, J. (Lecturer)
1 Oct 2015Activity: Talks and presentations › Conference presentations