Quantitative domain wall width measurement with coherent electrons

M. Beleggia, M.A. Schofield, Y. Zhu, G. Pozzi

Research output: Contribution to journalJournal articleResearchpeer-review


Quantitative measurements of domain wall widths in a magnetic thin foil of Nd2Fe14B are obtained by the analysis of coherent shadow deformation of the biprism in an electron microscope. Information related to the phase gradient in the direction, perpendicular to the biprism is extracted by comparing recorded images and simulations computed according to the experimental electron–optical configuration and by varying the domain wall width w. We demonstrate the usefulness of the technique for extraction of magnetic information at the nanometer scale.
Original languageEnglish
JournalJournal of Magnetism and Magnetic Materials
Issue number2
Pages (from-to)2696-2698
Number of pages3
Publication statusPublished - 2007
Externally publishedYes


  • Electron interferometry
  • Magnetic domain
  • Shadow imaging
  • Domain wall width
  • Electron holography


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