TY - JOUR
T1 - Quantitative Characterisation of Surface Texture
AU - De Chiffre, Leonardo
AU - Lonardo, P.M.
AU - Trumpold, H.
AU - Lucca, D.A.
AU - Goch, G.
AU - Brown, C. A.
AU - Raja, J.
AU - Hansen, Hans Nørgaard
PY - 2000
Y1 - 2000
N2 - This paper reviews the different methods used to give a quantitative characterisation of surface texture. The
paper contains a review of conventional 2D as well as 3D roughness parameters, with particular emphasis
on recent international standards and developments. It presents new texture characterisation methods, such
as fractals, wavelets, change trees and others, including for each method a short review, the parameters that
the new methods calculate, and applications of the methods to solve surface problems. The paper contains a
discussion on the relevance of the different parameters and quantification methods in terms of functional
correlations, and it addresses the need for reducing the large number of existing parameters. The review
considers the present situation and gives suggestions for future activities.
AB - This paper reviews the different methods used to give a quantitative characterisation of surface texture. The
paper contains a review of conventional 2D as well as 3D roughness parameters, with particular emphasis
on recent international standards and developments. It presents new texture characterisation methods, such
as fractals, wavelets, change trees and others, including for each method a short review, the parameters that
the new methods calculate, and applications of the methods to solve surface problems. The paper contains a
discussion on the relevance of the different parameters and quantification methods in terms of functional
correlations, and it addresses the need for reducing the large number of existing parameters. The review
considers the present situation and gives suggestions for future activities.
KW - MM00.65
M3 - Journal article
SN - 0007-8506
VL - 49
SP - 635
EP - 651
JO - CIRP Annals : Manufacturing Technology
JF - CIRP Annals : Manufacturing Technology
IS - 2
ER -