Quantifying the growth of individual graphene layers by in situ environmental transmission electron microscopy

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Abstract

The growth dynamics of layered carbon is studied by means of in situ transmission electron microscopy in order to obtain a deeper insight into the growth by chemical vapor deposition, which at present is the technique of choice for growing layered carbon. In situ growth of layered carbon structures on nickel using acetylene as carbon precursor gas is studied in the electron microscope at various gas pressures. By following the growth of individual graphene layers on the Ni surface, local growth rates are determined as a function of precursor pressure. Two growth regimes are identified, an initial rapid growth, which does not show a strong dependence on pressure, followed by a slower growth with a strong pressure dependence. (C) 2015 Elsevier Ltd. All rights reserved.
Original languageEnglish
JournalCarbon
Volume99
Pages (from-to)261-266
Number of pages6
ISSN0008-6223
DOIs
Publication statusPublished - 2016

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