Abstract
This paper evaluates and quantifies the repeatability of post-processing settings, such as surface determination, data fitting, and the definition of
the datum system, on the uncertainties of Computed Tomography (CT) measurements. The influence of post-processing contributions was
determined by calculating the standard deviation of 10 repeated measurement evaluations on the same data set. The evaluations were performed
on an industrial assembly. Each evaluation includes several dimensional and geometrical measurands that were expected to have different
responses to the various post-processing settings. It was found that the definition of the datum system had the largest impact on the uncertainty
with a standard deviation of a few microns. The surface determination and data fitting had smaller contributions with sub-micron repeatability.
| Original language | English |
|---|---|
| Journal | Procedia C I R P |
| Volume | 43 |
| Pages (from-to) | 297–302 |
| ISSN | 2212-8271 |
| DOIs | |
| Publication status | Published - 2016 |
| Event | 14th CIRP Conference on Computer Aided Tolerancing - Gothenburg, Sweden Duration: 18 May 2016 → 20 May 2016 http://www.chalmers.se/en/conference/cat2016/Pages/default.aspx |
Conference
| Conference | 14th CIRP Conference on Computer Aided Tolerancing |
|---|---|
| Country/Territory | Sweden |
| City | Gothenburg |
| Period | 18/05/2016 → 20/05/2016 |
| Internet address |
Bibliographical note
The Authors. Published by Elsevier B.V. This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/).Keywords
- Computed Tomography
- Measurement uncertainty
- Post-processing uncertainty
- Assembly
- Metrology