Abstract
We found that the dispersion of the ELID increases with the size and severity of the solar cell cracks, correlating with an increase in standard deviation and decrease in kurtosis. For shunted cells, we found that the ELID median is strongly correlated with the extent of cell shunting. Last, cells with damaged interconnect ribbons show current crowding and increased series resistance regions, characterized by increased dispersion and skewness of the ELID. These cell-level diagnostic parameters can be used to quantify the level of mismatch between the solar cells in the module, which can represent the extent of the module degradation, due to transportation, installation, or field operation. The method can be easily automated for quality control by module manufacturers or installers, or can be used as a diagnostic tool by plant operators and diagnostic service providers.
| Original language | English |
|---|---|
| Title of host publication | Proceedings of 33rd European Photovoltaic Solar Energy Conference and Exhibition |
| Publication date | 2017 |
| Pages | 1466-1472 |
| Publication status | Published - 2017 |
| Event | 33rd European PV Solar Energy Conference and Exhibition - RAI Convention & Exhibition Centre, Amsterdam, Netherlands Duration: 25 Sep 2017 → 29 Sep 2017 Conference number: 33 http://www.photovoltaic-conference.com |
Conference
| Conference | 33rd European PV Solar Energy Conference and Exhibition |
|---|---|
| Number | 33 |
| Location | RAI Convention & Exhibition Centre |
| Country | Netherlands |
| City | Amsterdam |
| Period | 25/09/2017 → 29/09/2017 |
| Internet address |
Cite this
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Quantification of solar cell failure signatures based on statistical analysis of electroluminescence images. / Spataru, Sergiu; Parikh, Harsh; Benatto, Gisele Alves dos Reis; Hacke, Peter; Sera, Dezso; Poulsen, Peter Behrensdorff.
Proceedings of 33rd European Photovoltaic Solar Energy Conference and Exhibition. 2017. p. 1466-1472.Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review
TY - GEN
T1 - Quantification of solar cell failure signatures based on statistical analysis of electroluminescence images
AU - Spataru, Sergiu
AU - Parikh, Harsh
AU - Benatto, Gisele Alves dos Reis
AU - Hacke, Peter
AU - Sera, Dezso
AU - Poulsen, Peter Behrensdorff
PY - 2017
Y1 - 2017
N2 - We propose a method to identify and quantify the extent of solar cell cracks, shunting, or damaged cell interconnects, present in crystalline silicon photovoltaic (PV) modules by statistical analysis of the electroluminescence (EL) intensity distributions of individual cells within the module. From the EL intensity distributions (ELID) of each cell, we calculated summary statistics such as standard deviation, median, skewness and kurtosis, and analyzed how they correlate with the type of the solar cell degradation. We found that the dispersion of the ELID increases with the size and severity of the solar cell cracks, correlating with an increase in standard deviation and decrease in kurtosis. For shunted cells, we found that the ELID median is strongly correlated with the extent of cell shunting. Last, cells with damaged interconnect ribbons show current crowding and increased series resistance regions, characterized by increased dispersion and skewness of the ELID. These cell-level diagnostic parameters can be used to quantify the level of mismatch between the solar cells in the module, which can represent the extent of the module degradation, due to transportation, installation, or field operation. The method can be easily automated for quality control by module manufacturers or installers, or can be used as a diagnostic tool by plant operators and diagnostic service providers.
AB - We propose a method to identify and quantify the extent of solar cell cracks, shunting, or damaged cell interconnects, present in crystalline silicon photovoltaic (PV) modules by statistical analysis of the electroluminescence (EL) intensity distributions of individual cells within the module. From the EL intensity distributions (ELID) of each cell, we calculated summary statistics such as standard deviation, median, skewness and kurtosis, and analyzed how they correlate with the type of the solar cell degradation. We found that the dispersion of the ELID increases with the size and severity of the solar cell cracks, correlating with an increase in standard deviation and decrease in kurtosis. For shunted cells, we found that the ELID median is strongly correlated with the extent of cell shunting. Last, cells with damaged interconnect ribbons show current crowding and increased series resistance regions, characterized by increased dispersion and skewness of the ELID. These cell-level diagnostic parameters can be used to quantify the level of mismatch between the solar cells in the module, which can represent the extent of the module degradation, due to transportation, installation, or field operation. The method can be easily automated for quality control by module manufacturers or installers, or can be used as a diagnostic tool by plant operators and diagnostic service providers.
M3 - Article in proceedings
SP - 1466
EP - 1472
BT - Proceedings of 33rd European Photovoltaic Solar Energy Conference and Exhibition
ER -