Quantification of local dislocation density using 3D synchrotron monochromatic X-ray microdiffraction

Guangni Zhou, Wolfgang Pantleon, Ruqing Xu, Wenjun Liu, Kai Chen*, Yubin Zhang*

*Corresponding author for this work

Research output: Contribution to journalJournal articleResearchpeer-review

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Abstract

A novel approach evolved from the classical Wilkens’ method has been developed to quantify the local dislocation density based on X-ray radial profiles obtained by 3D synchrotron monochromatic X-ray microdiffraction. A deformed Ni-based superalloy consisting of γ matrix and γ′ precipitates has been employed as model material. The quantitative results show that the local dislocation densities vary with the depths along the incident X-ray beam in both phases and are consistently higher in the γ matrix than in the γ′ precipitates. The results from X-ray microdiffraction are in general agreement with the transmission electron microscopic observations.
Original languageEnglish
JournalMaterials Research Letters
Volume9
Issue number4
Pages (from-to)183-189
ISSN2166-3831
DOIs
Publication statusPublished - 2021

Bibliographical note

This is an Open Access article distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Keywords

  • 3D synchrotron
  • Microdiffraction
  • Dislocation density
  • Ni-based superalloy
  • Transmission electron microscopy

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