Quantification of local dislocation density using 3D synchrotron monochromatic X-ray microdiffraction

Guangni Zhou, Wolfgang Pantleon, Ruqing Xu, Wenjun Liu, Kai Chen*, Yubin Zhang*

*Corresponding author for this work

    Research output: Contribution to journalJournal articleResearchpeer-review

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    A novel approach evolved from the classical Wilkens’ method has been developed to quantify the local dislocation density based on X-ray radial profiles obtained by 3D synchrotron monochromatic X-ray microdiffraction. A deformed Ni-based superalloy consisting of γ matrix and γ′ precipitates has been employed as model material. The quantitative results show that the local dislocation densities vary with the depths along the incident X-ray beam in both phases and are consistently higher in the γ matrix than in the γ′ precipitates. The results from X-ray microdiffraction are in general agreement with the transmission electron microscopic observations.
    Original languageEnglish
    JournalMaterials Research Letters
    Issue number4
    Pages (from-to)183-189
    Publication statusPublished - 2021

    Bibliographical note

    This is an Open Access article distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


    • 3D synchrotron
    • Microdiffraction
    • Dislocation density
    • Ni-based superalloy
    • Transmission electron microscopy


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