Abstract
A novel approach evolved from the classical Wilkens’ method has been developed to quantify the local dislocation density based on X-ray radial profiles obtained by 3D synchrotron monochromatic X-ray microdiffraction. A deformed Ni-based superalloy consisting of γ matrix and γ′ precipitates has been employed as model material. The quantitative results show that the local dislocation densities vary with the depths along the incident X-ray beam in both phases and are consistently higher in the γ matrix than in the γ′ precipitates. The results from X-ray microdiffraction are in general agreement with the transmission electron microscopic observations.
Original language | English |
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Journal | Materials Research Letters |
Volume | 9 |
Issue number | 4 |
Pages (from-to) | 183-189 |
ISSN | 2166-3831 |
DOIs | |
Publication status | Published - 2021 |
Bibliographical note
This is an Open Access article distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.Keywords
- 3D synchrotron
- Microdiffraction
- Dislocation density
- Ni-based superalloy
- Transmission electron microscopy