Quality assurance of fluorescence peak intensities in EDXRF analysis of environmental samples

A quality assurance methodology based on the Analysis of Precision was applied to results obtained by EDXRF. It was found that statistical control could be achieved in the processing of X-ray spectra with the program MicroSAMPO and an optimized Covell program, but not with a conventional Gaussian fitting program. Final results were consistent with an a priori precision of approximately 1% from the sample preparation stage, and no significant uncertainty could be attributed to the backscatter/fundamental parameter approach to the quantification. The method under investigation was found suitable for the analysis of environmental samples from chromium-contaminated grounds.