TY - JOUR
T1 - Quality assurance of fluorescence peak intensities in EDXRF analysis of environmental samples
AU - Højslet Christensen, L.
AU - Heydorn, K.
PY - 1990
Y1 - 1990
N2 - A quality assurance methodology based on the Analysis of Precision was applied to results obtained by EDXRF. It was found that statistical control could be achieved in the processing of X-ray spectra with the program MicroSAMPO and an optimized Covell program, but not with a conventional Gaussian fitting program. Final results were consistent with an a priori precision of approximately 1% from the sample preparation stage, and no significant uncertainty could be attributed to the backscatter/fundamental parameter approach to the quantification. The method under investigation was found suitable for the analysis of environmental samples from chromium-contaminated grounds.
AB - A quality assurance methodology based on the Analysis of Precision was applied to results obtained by EDXRF. It was found that statistical control could be achieved in the processing of X-ray spectra with the program MicroSAMPO and an optimized Covell program, but not with a conventional Gaussian fitting program. Final results were consistent with an a priori precision of approximately 1% from the sample preparation stage, and no significant uncertainty could be attributed to the backscatter/fundamental parameter approach to the quantification. The method under investigation was found suitable for the analysis of environmental samples from chromium-contaminated grounds.
U2 - 10.1016/0168-9002(90)90844-V
DO - 10.1016/0168-9002(90)90844-V
M3 - Journal article
SN - 0168-9002
VL - 299
SP - 562
EP - 566
JO - Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
JF - Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
IS - 1-3
ER -