Qualification and performance of the Low-Energy X-ray Reflectometer (LEXR)

P. L. Henriksen, F. E. Christensen, S. Massahi*, D. D.M. Ferreira, S. Svendsen, N. Gellert, L. M. Vu, A. S. Jegers, B. Shortt

*Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

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    Abstract

    A state-of-the-art Low-Energy X-ray Reflectometer (LEXR) is in operation at DTU Space with the main purpose of characterizing coatings for the Advanced Telescope for High-ENergy Astrophysics (ATHENA), a selected Lclass ESA mission. In particular, soft materials are difficult to characterize at higher energies so the 1.487 keV beamline compliments our existing 8.048 keV reflectometer, allowing for a more complete understanding of thinfilm X-ray characteristics. Documenting and qualifying the as-deposited coatings for X-ray telescope optics is of crucial importance, both to ensure that the effective area requirements are met, but also to quantify any temporal evolution in coating characteristics as well as the impact of manufacturing process parameters on mirror performance. It is notably relevant in the case of ATHENA, as there is a desire to enhance the low-energy performance by using a low-Z material overcoating on top of the Ir coating. We report on the commissioning and qualify the performance of the as-built 1.487 keV reflectometer as well as discuss measurement repeatability and system limitations
    Original languageEnglish
    Title of host publicationSpace Telescopes and Instrumentation 2020: Ultraviolet to Gamma Ray
    EditorsJan-Willem A. den Herder, Shouleh Nikzad, Kazuhiro Nakazawa
    Number of pages16
    Volume11444
    PublisherSPIE - International Society for Optical Engineering
    Publication date2020
    Article number114444J
    ISBN (Electronic)9781510636750, 9781510636767
    DOIs
    Publication statusPublished - 2020
    EventSpace Telescopes and Instrumentation 2020: Ultraviolet to Gamma Ray - Online event
    Duration: 14 Dec 202018 Dec 2020

    Conference

    ConferenceSpace Telescopes and Instrumentation 2020: Ultraviolet to Gamma Ray
    LocationOnline event
    Period14/12/202018/12/2020
    SeriesProceedings of SPIE - The International Society for Optical Engineering
    Volume11444
    ISSN0277-786X

    Keywords

    • LEXR
    • X-ray reflectometry
    • ATHENA
    • Optical coatings
    • X-ray optics
    • Thin-film characterization
    • Grazing incidence
    • X-ray telescopes

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