Pseudophase information from the complex analytic signal of speckle fields and its applications. Part I: Statistical properties of the analytic signal of a white-light speckle pattern applied to the microdisplacement measurement

W. Wang; N. Ishii; Steen Grüner Hanson; Y. Miyamoto; M. Takeda

Pseudophase information from the complex analytic signal of speckle fields and its applications. Part I: Statistical properties of the analytic signal of a white-light speckle pattern applied to the microdisplacement measurement

W. Wang, N. Ishii, Steen Grüner Hanson, Y. Miyamoto, M. Takeda

Research output: Contribution to journal › Journal article › Research › peer-review

Original language	English
Journal	Appl. Opt.
Volume	44
Pages (from-to)	4916-4921
Publication status	Published - 2005

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http://ao.osa.org/abstract.cfm?id=84815

Cite this

@article{949e5370c8994b3cae8a83c11dcf3368,

title = "Pseudophase information from the complex analytic signal of speckle fields and its applications. Part I: Statistical properties of the analytic signal of a white-light speckle pattern applied to the microdisplacement measurement",

keywords = "6-I optik",

author = "W. Wang and N. Ishii and Hanson, {Steen Gr{\"u}ner} and Y. Miyamoto and M. Takeda",

year = "2005",

language = "English",

volume = "44",

pages = "4916--4921",

journal = "Applied Optics",

issn = "1559-128X",

publisher = "Optical Society of America",

}

Wang, W, Ishii, N, Hanson, SG, Miyamoto, Y & Takeda, M 2005, 'Pseudophase information from the complex analytic signal of speckle fields and its applications. Part I: Statistical properties of the analytic signal of a white-light speckle pattern applied to the microdisplacement measurement', Appl. Opt., vol. 44, pp. 4916-4921. <http://ao.osa.org/abstract.cfm?id=84815>

Pseudophase information from the complex analytic signal of speckle fields and its applications. Part I: Statistical properties of the analytic signal of a white-light speckle pattern applied to the microdisplacement measurement. / Wang, W.; Ishii, N.; Hanson, Steen Grüner; Miyamoto, Y.; Takeda, M.

In: Appl. Opt., Vol. 44, 2005, p. 4916-4921.

Research output: Contribution to journal › Journal article › Research › peer-review

TY - JOUR

T1 - Pseudophase information from the complex analytic signal of speckle fields and its applications. Part I: Statistical properties of the analytic signal of a white-light speckle pattern applied to the microdisplacement measurement

AU - Wang, W.

AU - Ishii, N.

AU - Hanson, Steen Grüner

AU - Miyamoto, Y.

AU - Takeda, M.

PY - 2005

Y1 - 2005

KW - 6-I optik

M3 - Journal article

VL - 44

SP - 4916

EP - 4921

JO - Applied Optics

JF - Applied Optics

SN - 1559-128X

ER -