Production bias driven defect accumulation in the transient regime

B.N. Singh, A.J.E. Foreman, H. Trinkaus

    Research output: Contribution to journalJournal articleResearch

    Original languageEnglish
    JournalPlasma Devices Oper.
    Volume3
    Pages (from-to)115-129
    Publication statusPublished - 1994

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