Proceedings of Design, Automation and Test in Europe (DATE07)

Rudy Lawereins (Editor), Jan Madsen (Editor)

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    Welcome to the DATE 07 Conference Proceedings. DATE combines the world’s leading electronic systems design conference and Europe's leading international exhibition for electronic design, automation and test, from system level hardware and software implementation right down to integrated circuit design. The DATE 07 event features a technical program with 78 sessions covering the latest in system design and embedded software, IC design methodologies and EDA tool developments, together with an exhibition with the leading EDA, silicon and IP providers showing their new products and services. Challenges that you all face or soon will face in your daily practice are the increasing design complexity of highly integrated systems, the introduction of reconfigurability and embedded software, and the control of power, reliability and variability in nanometer IC designs. All these issues will be addressed in this year’s DATE event. At its tenth anniversary, DATE 07 has again reached a record number (933) of submissions, compared to previous years and compared to other EDA conferences worldwide. With submissions coming from all five continents and almost fifty countries, DATE has truly become an international conference. DATE is now the world’s premier event in electronic system design. The submissions have been reviewed by the more than 600 members of the Technical Programme Committee. After a thorough review and selection process (with an average of 4.6 reviews per paper), finally 208 papers were selected for presentation at the conference. In addition, 57 papers were selected for Interactive Presentations, which highlight quality work in progress. Together with the invited special sessions (panels, embedded tutorials and hot topic sessions) this has resulted in a high-quality technical programme with 78 sessions covering the latest in system design and embedded software, IC design methodologies and EDA tool developments. One of the main strengths of the conference is a wide but high-quality coverage of design, design automation and test topics, from the system level (including PCB and FPGA) to the integrated circuit level. In addition, for the third year a special embedded software track is offered to allow for the increasing importance of software in embedded systems. Compared with previous years, submissions in design, test and embedded software have grown significantly, showing a clear trend toward a holistic view and a comprehensive system design focus.
    Original languageEnglish
    Number of pages1,691
    ISBN (Print)978-3-9810801-2-4
    Publication statusPublished - 2007

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