Probing the structure of wafer bonded interfaces: A comparison of X-ray diffraction data with keating energy calculations

P.B. Howes; M. Nielsen; R. Feidenhans'l; F. Grey

Probing the structure of wafer bonded interfaces: A comparison of X-ray diffraction data with keating energy calculations

P.B. Howes, M. Nielsen, R. Feidenhans'l, F. Grey

Research output: Contribution to conference › Conference abstract for conference › Research

Original language	English
Publication date	1999
Publication status	Published - 1999
Event	1999 Joint international meeting: 196. Meeting of the Electrochemical Society; 1999 Fall meeting of the Electrochemical Society of Japan - Honolulu, HI, United States Duration: 17 Oct 1999 → 22 Oct 1999 http://www.electrochem.org/meetings/biannual/196/meeting.htm

Conference

Conference	1999 Joint international meeting: 196. Meeting of the Electrochemical Society; 1999 Fall meeting of the Electrochemical Society of Japan
Country/Territory	United States
City	Honolulu, HI
Period	17/10/1999 → 22/10/1999
Internet address	http://www.electrochem.org/meetings/biannual/196/meeting.htm

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title = "Probing the structure of wafer bonded interfaces: A comparison of X-ray diffraction data with keating energy calculations",

keywords = "Nye funktionelle materialer",

author = "P.B. Howes and M. Nielsen and R. Feidenhans'l and F. Grey",

year = "1999",

language = "English",

note = "1999 Joint international meeting: 196. Meeting of the Electrochemical Society; 1999 Fall meeting of the Electrochemical Society of Japan ; Conference date: 17-10-1999 Through 22-10-1999",

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Howes, PB, Nielsen, M, Feidenhans'l, R & Grey, F 1999, 'Probing the structure of wafer bonded interfaces: A comparison of X-ray diffraction data with keating energy calculations', 1999 Joint international meeting: 196. Meeting of the Electrochemical Society; 1999 Fall meeting of the Electrochemical Society of Japan, Honolulu, HI, United States, 17/10/1999 - 22/10/1999.

Probing the structure of wafer bonded interfaces: A comparison of X-ray diffraction data with keating energy calculations. / Howes, P.B.; Nielsen, M.; Feidenhans'l, R. et al.
1999. Abstract from 1999 Joint international meeting: 196. Meeting of the Electrochemical Society; 1999 Fall meeting of the Electrochemical Society of Japan, Honolulu, HI, United States.

Research output: Contribution to conference › Conference abstract for conference › Research

TY - ABST

T1 - Probing the structure of wafer bonded interfaces: A comparison of X-ray diffraction data with keating energy calculations

AU - Howes, P.B.

AU - Nielsen, M.

AU - Feidenhans'l, R.

AU - Grey, F.

PY - 1999

Y1 - 1999

KW - Nye funktionelle materialer

M3 - Conference abstract for conference

T2 - 1999 Joint international meeting: 196. Meeting of the Electrochemical Society; 1999 Fall meeting of the Electrochemical Society of Japan

Y2 - 17 October 1999 through 22 October 1999

ER -