Probing the structure of wafer bonded interfaces: A comparison of X-ray diffraction data with keating energy calculations

P.B. Howes, M. Nielsen, R. Feidenhans'l, F. Grey

    Research output: Contribution to conferenceConference abstract for conferenceResearch

    Original languageEnglish
    Publication date1999
    Publication statusPublished - 1999
    Event1999 Joint international meeting: 196. Meeting of the Electrochemical Society; 1999 Fall meeting of the Electrochemical Society of Japan - Honolulu, HI, United States
    Duration: 17 Oct 199922 Oct 1999
    http://www.electrochem.org/meetings/biannual/196/meeting.htm

    Conference

    Conference1999 Joint international meeting: 196. Meeting of the Electrochemical Society; 1999 Fall meeting of the Electrochemical Society of Japan
    CountryUnited States
    CityHonolulu, HI
    Period17/10/199922/10/1999
    Internet address

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