Probe for testing electrical properties of a test sample

Research output: PatentPatent – Annual report year: 2012Research

View graph of relations

A probe for testing electrical properties of test samples includes a body having a probe arm defining proximal and distal ends, the probe arm extending from the body at the proximal end of the probe arm, whereby a first axis is defined by the proximal and the distal ends. The probe arm defines a geometry allowing flexible movement of the probe arm along the first axis and along a second axis perpendicular to the first axis, and along a third axis orthogonal to a plane defined by the first axis and the second axis.
Original languageEnglish
IPCG01R31/00
Patent numberUS8310258
Filing date13/11/2012
CountryUnited States
Priority date31/10/2006
Priority numberWO2006DK00603
Publication statusPublished - 2012

Bibliographical note

Also published as: US2009219047, EP1780550, KR20080065630, KR101291401, JP2009513986, JP5249769, IL190826, EP2293086, EP2293086, EP1946124, WO2007051471, CN101300496, and CN101300496.

ID: 101317408