Probe for testing electrical properties of a test sample

Dirch Hjorth Petersen; Torben Michael Hansen; Peter Rasmus Ebsen Petersen

Probe for testing electrical properties of a test sample

Dirch Hjorth Petersen (Inventor), Torben Michael Hansen (Inventor), Peter Rasmus Ebsen Petersen (Inventor)

Department of Physics

Research output: Patent

Abstract

A probe for testing electrical properties of test samples includes a body having a probe arm defining proximal and distal ends, the probe arm extending from the body at the proximal end of the probe arm, whereby a first axis is defined by the proximal and the distal ends. The probe arm defines a geometry allowing flexible movement of the probe arm along the first axis and along a second axis perpendicular to the first axis, and along a third axis orthogonal to a plane defined by the first axis and the second axis.

Original language	English
IPC	G01R31/00
Patent number	US8310258
Filing date	13/11/2012
Country	United States
Priority date	31/10/2006
Priority number	WO2006DK00603
Publication status	Published - 2012

Bibliographical note

Also published as: US2009219047, EP1780550, KR20080065630, KR101291401, JP2009513986, JP5249769, IL190826, EP2293086, EP2293086, EP1946124, WO2007051471, CN101300496, and CN101300496.

Cite this

Petersen, D. H., Hansen, T. M., & Petersen, P. R. E. (2012). IPC No. G01R31/00. Probe for testing electrical properties of a test sample. (Patent No. US8310258).

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AB - A probe for testing electrical properties of test samples includes a body having a probe arm defining proximal and distal ends, the probe arm extending from the body at the proximal end of the probe arm, whereby a first axis is defined by the proximal and the distal ends. The probe arm defines a geometry allowing flexible movement of the probe arm along the first axis and along a second axis perpendicular to the first axis, and along a third axis orthogonal to a plane defined by the first axis and the second axis.

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Y2 - 2012/11/13

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