Probe for testing electrical properties of a test sample

Dirch Hjorth Petersen; Torben Michael Hansen; Peter Rasmus Ebsen Petersen

Probe for testing electrical properties of a test sample

Dirch Hjorth Petersen (Inventor), Torben Michael Hansen (Inventor), Peter Rasmus Ebsen Petersen (Inventor)

Department of Physics

Research output: Patent

Abstract

A probe for testing electrical properties of test samples includes a body having a probe arm defining proximal and distal ends, the probe arm extending from the body at the proximal end of the probe arm, whereby a first axis is defined by the proximal and the distal ends. The probe arm defines a geometry allowing flexible movement of the probe arm along the first axis and along a second axis perpendicular to the first axis, and along a third axis orthogonal to a plane defined by the first axis and the second axis.

Original language	English
IPC	G01R31/00
Patent number	US8310258
Filing date	13/11/2012
Country	United States
Priority date	31/10/2006
Priority number	WO2006DK00603
Publication status	Published - 2012

Bibliographical note

Also published as: US2009219047, EP1780550, KR20080065630, KR101291401, JP2009513986, JP5249769, IL190826, EP2293086, EP2293086, EP1946124, WO2007051471, CN101300496, and CN101300496.

Cite this

@misc{4775abec74e94d8f8c06b467aef46936,

title = "Probe for testing electrical properties of a test sample",

abstract = "A probe for testing electrical properties of test samples includes a body having a probe arm defining proximal and distal ends, the probe arm extending from the body at the proximal end of the probe arm, whereby a first axis is defined by the proximal and the distal ends. The probe arm defines a geometry allowing flexible movement of the probe arm along the first axis and along a second axis perpendicular to the first axis, and along a third axis orthogonal to a plane defined by the first axis and the second axis.",

author = "Petersen, {Dirch Hjorth} and Hansen, {Torben Michael} and Petersen, {Peter Rasmus Ebsen}",

note = "Also published as: US2009219047, EP1780550, KR20080065630, KR101291401, JP2009513986, JP5249769, IL190826, EP2293086, EP2293086, EP1946124, WO2007051471, CN101300496, and CN101300496.; US8310258; G01R31/00",

year = "2012",

language = "English",

type = "Patent",

}

TY - PAT

T1 - Probe for testing electrical properties of a test sample

AU - Petersen, Dirch Hjorth

AU - Hansen, Torben Michael

AU - Petersen, Peter Rasmus Ebsen

N1 - Also published as: US2009219047, EP1780550, KR20080065630, KR101291401, JP2009513986, JP5249769, IL190826, EP2293086, EP2293086, EP1946124, WO2007051471, CN101300496, and CN101300496.

PY - 2012

Y1 - 2012

N2 - A probe for testing electrical properties of test samples includes a body having a probe arm defining proximal and distal ends, the probe arm extending from the body at the proximal end of the probe arm, whereby a first axis is defined by the proximal and the distal ends. The probe arm defines a geometry allowing flexible movement of the probe arm along the first axis and along a second axis perpendicular to the first axis, and along a third axis orthogonal to a plane defined by the first axis and the second axis.

AB - A probe for testing electrical properties of test samples includes a body having a probe arm defining proximal and distal ends, the probe arm extending from the body at the proximal end of the probe arm, whereby a first axis is defined by the proximal and the distal ends. The probe arm defines a geometry allowing flexible movement of the probe arm along the first axis and along a second axis perpendicular to the first axis, and along a third axis orthogonal to a plane defined by the first axis and the second axis.

M3 - Patent

M1 - US8310258

Y2 - 2012/11/13

ER -