Abstract
The effect of pressure on the crystallization behavior of metallic glass Fe72P11C6Al5B4Ga2 alloy with a wide supercooled liquid region has been investigated by in situ high-pressure and high-temperature x-ray diffraction measurements using synchrotron radiation. In the pressure range from 0 to 2.4 GPa, the crystallization temperature, Tx, increases with pressure, p, having a slope of 30 K/GPa while a minimum in Tx was detected in the range from 2.4 to 3.9 GPa. With a further increase of p, Tx is independent of p. The Tx vs p behavior can be qualitatively explained by the suppression of atomic mobility and changes of the Gibbs free energy of various phases with pressure. ©2000 American Institute of Physics.
| Original language | English |
|---|---|
| Journal | Journal of Applied Physics |
| Volume | 87 |
| Issue number | 5 |
| Pages (from-to) | 2664-2666 |
| ISSN | 0021-8979 |
| DOIs | |
| Publication status | Published - 2000 |
Bibliographical note
Copyright (2000) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.Fingerprint
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