Preparing polished crystal slices with high precision orientation

S. Ipsen Mathiesen, Leif Gerward, O. Pedersen

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Abstract

A polishing procedure is described which utilizes a high precision Laue technique for crystal orientation. Crystal slices with their final polished surfaces parallel to a crystallographic plane within 0.02° can be prepared. ©1974 The American Institute of Physics
Original languageEnglish
JournalReview of Scientific Instruments
Volume45
Issue number2
Pages (from-to)278-279
ISSN0034-6748
DOIs
Publication statusPublished - 1974

Bibliographical note

Copyright (1974) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.

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