Preparation of epitaxial La0.6Ca0.4Mn1-xFexO3 (x=0, 0.2) thin films: Variation of the oxygen content

Stela Canulescu, T H Lippert, A Wokaun, R Robert, D Logvinovich, A Weidenkaff, M Doebeli, M Schneider

Research output: Contribution to journalConference articleResearchpeer-review

Abstract

Perovskite thin films with a nominal composition of La0.6Ca0.4Mn1-xFexO3 (x= 0, 0.2) were deposited by pulsed reactive crossed beam laser ablation. The film properties, such as electrical conductivity and magnetoresistance are studied as a function of the oxygen content and substrate type. The oxygen content of the thin films was determined by Rutherford Backscattering and controlled by varying the background gas pressure, pressure of the gas pulse and by using alternatively O-2 and N2O as the gas pulse. LaAlO3 and SrTiO3 were used as substrates at deposition temperature of 650 degrees C. The grown films were analyzed by X-ray diffraction in order to optimize the growth conditions, i.e. to obtain epitaxial thin films. Thin films doped with 20% Fe were grown under the same experimental conditions as the undoped LCMO films and the effect of the doping on the structural and transport properties of the thin films has been investigated. The temperature of the metal-insulator transition was measured as a function of the oxygen content and substrate type. (C) 2007 Published by Elsevier Ltd.
Original languageEnglish
JournalProgress in Solid State Chemistry
Volume35
Issue number2-4
Pages (from-to)241-248
ISSN0079-6786
DOIs
Publication statusPublished - 2007
Externally publishedYes
EventInternational Conference on Perovskites Properties and Potential Applications - Dubendorf, SWITZERLAND,
Duration: 1 Jan 2005 → …

Conference

ConferenceInternational Conference on Perovskites Properties and Potential Applications
CityDubendorf, SWITZERLAND,
Period01/01/2005 → …

Cite this

Canulescu, S., Lippert, T. H., Wokaun, A., Robert, R., Logvinovich, D., Weidenkaff, A., Doebeli, M., & Schneider, M. (2007). Preparation of epitaxial La0.6Ca0.4Mn1-xFexO3 (x=0, 0.2) thin films: Variation of the oxygen content. Progress in Solid State Chemistry, 35(2-4), 241-248. https://doi.org/10.1016/j.progsolidstchem.2007.01.023