Prediction of phase formation sequence and phase stability in binary metal-aluminum thin-film systems using the effective heat of formation rule

R. Pretorius, A.M. Vredenberg, F.W. Saris, R. de Reus

    Research output: Contribution to journalJournal articleResearchpeer-review

    Original languageEnglish
    JournalJournal of Applied Physics
    Volume70
    Pages (from-to)3636-3646
    ISSN0021-8979
    Publication statusPublished - 1991

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