Precise determination of extended dislocation boundary plane in transmission electron microscopy

Research output: Contribution to journal › Journal article › Research › peer-review

Original language	English
Journal	Materials Science and Technology (United Kingdom)
Volume	21
Pages (from-to)	1379-1382
ISSN	0267-0836
DOIs	https://doi.org/10.1179/174328405X71576
Publication status	Published - 2005

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@article{5e9956119f0349d986104df35e0dfbe2,

title = "Precise determination of extended dislocation boundary plane in transmission electron microscopy",

keywords = "5-I nano",

author = "X. Huang",

year = "2005",

doi = "10.1179/174328405X71576",

language = "English",

volume = "21",

pages = "1379--1382",

journal = "Materials Science and Technology (United Kingdom)",

issn = "0267-0836",

publisher = "SAGE Publications Inc.",

}

TY - JOUR

T1 - Precise determination of extended dislocation boundary plane in transmission electron microscopy

AU - Huang, X.

PY - 2005

Y1 - 2005

KW - 5-I nano

U2 - 10.1179/174328405X71576

DO - 10.1179/174328405X71576

M3 - Journal article

SN - 0267-0836

VL - 21

SP - 1379

EP - 1382

JO - Materials Science and Technology (United Kingdom)

JF - Materials Science and Technology (United Kingdom)

ER -