Practical Hole-Free Phase Plate Imaging: Principles, Advantages and Pitfalls

M. Malac; M. Bergen; M. Kawasaki; Marco Beleggia; R. Egerton; H. Furukawa; M. Shimizu

doi:10.1017/S1431927612004278

Practical Hole-Free Phase Plate Imaging: Principles, Advantages and Pitfalls

M. Malac
, M. Bergen
, M. Kawasaki
, Marco Beleggia
, R. Egerton
, H. Furukawa
, M. Shimizu

National Institute of Nanotechnology
JEOL USA, Inc.
System in Frontier Inc.

Research output: Contribution to journal › Conference abstract in journal › Research › peer-review

Original language	English
Journal	Microscopy and Microanalysis
Volume	18
Issue number	Supplement S2
Pages (from-to)	484-485
ISSN	1431-9276
DOIs	https://doi.org/10.1017/S1431927612004278
Publication status	Published - 2012
Event	Microscopy and Microanalysis 2012 Meeting - Phoenix Convention Center, Phoenix, AZ, United States Duration: 29 Jul 2012 → 2 Aug 2012 http://www.microscopy.org/MandM/2012/index.cfm

Conference

Conference	Microscopy and Microanalysis 2012 Meeting
Location	Phoenix Convention Center
Country/Territory	United States
City	Phoenix, AZ
Period	29/07/2012 → 02/08/2012
Internet address	http://www.microscopy.org/MandM/2012/index.cfm

Bibliographical note

Extended abstract of a paper.

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10.1017/S1431927612004278

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Cite this

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title = "Practical Hole-Free Phase Plate Imaging: Principles, Advantages and Pitfalls",

author = "M. Malac and M. Bergen and M. Kawasaki and Marco Beleggia and R. Egerton and H. Furukawa and M. Shimizu",

note = "Extended abstract of a paper.; Microscopy and Microanalysis 2012 Meeting, M and M 2012 ; Conference date: 29-07-2012 Through 02-08-2012",

year = "2012",

doi = "10.1017/S1431927612004278",

language = "English",

volume = "18",

pages = "484--485",

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TY - ABST

T1 - Practical Hole-Free Phase Plate Imaging: Principles, Advantages and Pitfalls

AU - Malac, M.

AU - Bergen, M.

AU - Kawasaki, M.

AU - Beleggia, Marco

AU - Egerton, R.

AU - Furukawa, H.

AU - Shimizu, M.

N1 - Extended abstract of a paper.

PY - 2012

Y1 - 2012

U2 - 10.1017/S1431927612004278

DO - 10.1017/S1431927612004278

M3 - Conference abstract in journal

SN - 1431-9276

VL - 18

SP - 484

EP - 485

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - Supplement S2

T2 - Microscopy and Microanalysis 2012 Meeting

Y2 - 29 July 2012 through 2 August 2012

ER -