Practical Hole-Free Phase Plate Imaging: Principles, Advantages and Pitfalls

M. Malac, M. Bergen, M. Kawasaki, Marco Beleggia, R. Egerton, H. Furukawa, M. Shimizu

    Research output: Contribution to journalConference abstract in journalResearchpeer-review

    Original languageEnglish
    JournalMicroscopy and Microanalysis
    Volume18
    Issue numberSupplement S2
    Pages (from-to)484-485
    ISSN1431-9276
    DOIs
    Publication statusPublished - 2012
    Event Microscopy and Microanalysis 2012 Meeting - Phoenix Convention Center, Phoenix, AZ, United States
    Duration: 29 Jul 20122 Aug 2012
    http://www.microscopy.org/MandM/2012/index.cfm

    Conference

    Conference Microscopy and Microanalysis 2012 Meeting
    LocationPhoenix Convention Center
    CountryUnited States
    CityPhoenix, AZ
    Period29/07/201202/08/2012
    Internet address

    Bibliographical note

    Extended abstract of a paper.

    Cite this

    Malac, M., Bergen, M., Kawasaki, M., Beleggia, M., Egerton, R., Furukawa, H., & Shimizu, M. (2012). Practical Hole-Free Phase Plate Imaging: Principles, Advantages and Pitfalls. Microscopy and Microanalysis, 18(Supplement S2), 484-485. https://doi.org/10.1017/S1431927612004278