Practical aspects of spherical near-field antenna measurements using a high-order probe

Tommi Laitinen, Sergey Pivnenko, Jeppe Majlund Nielsen, Olav Breinbjerg

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearch


Two practical aspects related to accurate antenna pattern characterization by probe-corrected spherical near-field antenna measurements with a high-order probe are examined. First, the requirements set by an arbitrary high-order probe on the scanning technique are pointed out. Secondly, a channel balance calibration procedure for a high-order dual-port probe with non-identical ports is presented, and the requirements set by this procedure for the probe are discussed.
Original languageEnglish
Title of host publicationProceedings of the European Conference on Antennas and Propagation
Publication date2006
Publication statusPublished - 2006
Event1st European Conference on Antennas and Propagation - Nice, France
Duration: 6 Nov 200610 Nov 2006
Conference number: 1


Conference1st European Conference on Antennas and Propagation

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