Abstract
Two practical aspects related to accurate antenna pattern characterization by probe-corrected spherical near-field antenna measurements with a high-order probe are examined. First, the requirements set by an arbitrary high-order probe on the scanning technique are pointed out. Secondly, a channel balance calibration procedure for a high-order dual-port probe with non-identical ports is presented, and the requirements set by this procedure for the probe are discussed.
| Original language | English |
|---|---|
| Title of host publication | Proceedings of the European Conference on Antennas and Propagation |
| Publication date | 2006 |
| Publication status | Published - 2006 |
| Event | 1st European Conference on Antennas and Propagation - Nice, France Duration: 6 Nov 2006 → 10 Nov 2006 Conference number: 1 |
Conference
| Conference | 1st European Conference on Antennas and Propagation |
|---|---|
| Number | 1 |
| Country/Territory | France |
| City | Nice |
| Period | 06/11/2006 → 10/11/2006 |