Polarimetric Edge Detector Based on the Complex Wishart Distribution

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

    269 Downloads (Pure)

    Abstract

    A new edge detector for polarimetric SAR data has been developed. The edge detector is based on a newly developed test statistic for equality of two complex covariance matrices following the complex Wishart distribution and an associated asymptotic probability for the test statistic. The new polarimetric edge detector provides a constant false alarm rate and it utilizes the full polarimetric information. The edge detector has been applied to polarimetric SAR data from the Danish dual-frequency, airborne polarimetric SAR, EMISAR. The results show clearly an improved edge detection performance for the full polarimetric detector compared to single channel approaches.
    Original languageEnglish
    Title of host publicationProceedings on IEEE 2001 International Geoscience and Remote Sensing Symposium
    Volume7
    Publication date2001
    ISBN (Print)0-7803-7031-7
    DOIs
    Publication statusPublished - 2001
    Event2001 Geoscience and Remote Sensing Symposium - Sydney, Australia
    Duration: 9 Jul 200113 Jul 2001
    http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=7695

    Conference

    Conference2001 Geoscience and Remote Sensing Symposium
    Country/TerritoryAustralia
    CitySydney
    Period09/07/200113/07/2001
    Internet address

    Bibliographical note

    Copyright: 2000 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE

    Fingerprint

    Dive into the research topics of 'Polarimetric Edge Detector Based on the Complex Wishart Distribution'. Together they form a unique fingerprint.

    Cite this