Planar defects, dislocations, and coherently scattering-size in GdBa2Cu3O7-x high-Tc thin films determined by high resolution X-ray diffraction

Gábor Csiszár, Xiaofen Li, Gyula Zilahi, Levente Balogh, Tamás Ungár

Research output: Contribution to journalJournal articleResearchpeer-review

Abstract

The frequency of planar defects, the average dislocation densities, and coherent domain size in epitaxial GdBa2Cu3O7-x high Tc thin films, with altering CuO2 and CuO planes, are measured by fitting full widths at half maximum values of 00l type reflections using a model function based on intensity distribution configurations in reciprocal space. The reduction of the dislocation density during oxygenation seems to be an unavoidable condition to obtain superconductivity in GdBa 2Cu3O7-x thin films. © 2013 American Institute of Physics.
Original languageEnglish
JournalJournal of Applied Physics
Volume113
Issue number3
Pages (from-to)033903
Number of pages6
ISSN0021-8979
DOIs
Publication statusPublished - 2013

Keywords

  • Defects
  • Oxygenation
  • Thin films
  • X ray diffraction
  • Coherent scattering

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