Physical limits of semiconductor laser operation: A time-resolved analysis of catastrophic optical damage

Mathias Ziegler, Martin Hempel, Henning Engelbrecht Larsen, Jens W. Tomm, Peter E. Andersen, Sønnik Clausen, Stella N. Elliott, Thomas Elsaesser

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    Abstract

    The early stages of catastrophic optical damage (COD) in 808 nm emitting diode lasers are mapped by simultaneously monitoring the optical emission with a 1 ns time resolution and deriving the device temperature from thermal images. COD occurs in highly localized damage regions on a 30 to 400 ns time scale which is determined by the accumulation of excess energy absorbed from the optical output. We identify regimes in which COD is avoided by the proper choice of operation parameters.
    Original languageEnglish
    JournalApplied Physics Letters
    Volume97
    Issue number2
    Pages (from-to)021110
    ISSN0003-6951
    DOIs
    Publication statusPublished - 2010

    Bibliographical note

    Copyright (2010) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.

    Keywords

    • Combustion pollution control technologies
    • Fusion energy

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