Abstract
Boron - and nitrogen-doped 6H silicon carbide epilayers grown on low off-axis 6H silicon carbide substrates have been characterized by photoluminescence and Raman spectroscopy. Combined with secondary ion mass spectrometry results, preferable doping type and optimized concentration could be proposed to obtain strong donor to acceptor pair band luminescence.
Original language | English |
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Title of host publication | Proceedings of ICSCRM |
Publication date | 2011 |
Pages | We P-58 |
Publication status | Published - 2011 |
Event | 14th International Conference on Silicon Carbide and Related Materials 2011 - Cleveland, United States Duration: 11 Sept 2011 → 16 Sept 2011 |
Conference
Conference | 14th International Conference on Silicon Carbide and Related Materials 2011 |
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Country/Territory | United States |
City | Cleveland |
Period | 11/09/2011 → 16/09/2011 |
Keywords
- Raman spectroscopy
- 6H-SiC
- Photoluminescence
- Sublimation epitaxy