Abstract
The Ørsted Star Imager or Advanced Stellar Compass (ASC), includes
the full functionallity of a traditional star tracker plus
autonomy, i.e. it is able to quickly and autonomously solve "the
lost in space" attitude problem, and determine its attitude with
high precision. The design also provides robust error rejection
and fault recovery, as well as graceful radiation induced, false
object and thermal load degradation. The instrument was developed
from concept to flight model within 3 years. The instrument
surpasses the initial specifications for all design parameters.
For Precision, Computational speed and Fault detection and
recovery substantially. The high performance and low cost design
was realized by the use of advanced high level integrated chips,
along with a design philosophy of maximum autonomy at all levels.
This approach necessitated the use of a prototyping facility which
could do extensive component testing and screening which addressed
the issues of reliability, thermo-mechanical properties, and
radiation sensitivity of the commercial IC's. The facility helped
to control costs by generating early information on component
survival in space. The development philosophy and process are
described, starting with the system specifications and its derived
design drivers, through the design process and its iterations,
including the specification, design and capability of the
prototyping facility, and ending with the final system design. The
rationale for IC-level selection and system flexibility are
addressed.KEY WORDS: Micro satellite, stellar compass, star
tracker, attitude determination.
Original language | English |
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Title of host publication | Proceedings SPIE volume 2810 |
Place of Publication | Denver |
Publisher | SPIE |
Publication date | 1996 |
Pages | 222-229 |
Publication status | Published - 1996 |
Event | SPIE'S 1996 International Symposium on Optical Science, Engineering, and Instrumentation - Denver, United States Duration: 4 Aug 1996 → 9 Aug 1996 |
Conference
Conference | SPIE'S 1996 International Symposium on Optical Science, Engineering, and Instrumentation |
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Country/Territory | United States |
City | Denver |
Period | 04/08/1996 → 09/08/1996 |