Phase‐shift and phase‐contrast images of pancake superconducting vortices

Marco Beleggia, Giulio Pozzi

Research output: Contribution to journalConference articleResearchpeer-review

Abstract

Recently, a Fourier space approach has been developed, which can be fruitfully applied for calculating the phase‐shift and phase‐contrast transmission electron microscope images of superconducting pancake fluxons in high‐Tc layered specimens. In this work, the results obtained by a very simplified model, where the specimen is approximated by three thin layers, are presented and discussed. These model calculations, although oversimplified, can nonetheless give useful hints on the expected images of pancake vortices not piercing the specimen but residing in it or near its surfaces, or pinned by a tilted columnar defect. Furthermore, the model calculations motivate more elaborate and accurate, but time and memory consuming, calculations, which can be carried out by increasing the number of layers.
Original languageEnglish
JournalJournal of Electron Microscopy
Volume51
Issue numberSupplement 1
Pages (from-to)73-77
Number of pages5
ISSN0022-0744
DOIs
Publication statusPublished - 2002
Externally publishedYes
Event8th Conference on Frontiers of Electron Microscopy in Materials Science - Shimane, Japan
Duration: 13 Nov 200017 Nov 2000
Conference number: 8

Conference

Conference8th Conference on Frontiers of Electron Microscopy in Materials Science
Number8
CountryJapan
CityShimane
Period13/11/200017/11/2000

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