Synchrotron radiation is an excellent tool for studies of structural phase transitions. Among others it enables to follow the transition as a function of the parameter inducing the transition (e.g. pressure, temperature) and time. The latter possibility is due to the short recording times resulting from the high intensity of S.R. For these studies simultaneous recording of the whole diffraction pattern is of great importance. This is achieved either by using a monochromatic beam and a position sensitive detector (PSD) or by using x-ray energy dispersive diffraction (XED). The first method is described only briefly because of its analogy to the conventional method. In the XED method one uses a polychromatic "white" incident beam, a fixed scattering angle and an energy dispersive detector. The main characteristics of the method is the simultaneous recording of the whole diffraction pattern and the fixed scattering angle. The XED method is discussed in some detail. Examples of studies of phase transitions using both methods are briefly described.
|Place of Publication||Roskilde|
|Publisher||Risø National Laboratory|
|Number of pages||34|
|Publication status||Published - 1988|