Abstract
We report our study on magnetic structural evolution of artificially patterned micron and submicron magnetic arrays as a function of applied field using in situ electron microscopy. To understand magnetic dynamics and switching behavior we employ our newly developed phase retrieval method, based on Lorentz phase microscopy, to map local induction distribution at nanometric scale. We outline the principle of the new method and discuss its advantages and drawbacks in comparison with off-axis electron holography.
Original language | English |
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Journal | Microscopy and Microanalysis |
Volume | 9 |
Issue number | Supplement S02 |
Pages (from-to) | 308-309 |
Number of pages | 2 |
ISSN | 1431-9276 |
DOIs | |
Publication status | Published - 2003 |
Externally published | Yes |
Event | Microscopy and Microanalysis 2003 - San Antonia, TX, United States Duration: 3 Aug 2003 → 7 Aug 2003 |
Conference
Conference | Microscopy and Microanalysis 2003 |
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Country/Territory | United States |
City | San Antonia, TX |
Period | 03/08/2003 → 07/08/2003 |