Performance of multilayer coated silicon pore optics

M. D. Ackermann, M. J. Collon, Carsten P. Cooper-Jensen, Finn Erland Christensen, M. Krumrey, L. Cibik, S. Marggraf, M. Bavdaz, D. Lumb, B. Shortt

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Abstract

The requirements for the IXO (International X-ray Observatory) telescope are very challenging in respect of angular resolution and effective area. Within a clear aperture with 1.7 m > R > 0.25 m that is dictated by the spacecraft envelope, the optics technology must be developed to satisfy simultaneously requirements for effective area of 2.5 m2 at 1.25 keV, 0.65 m2 at 6 keV and 150 cm2 at 30 keV. The reflectivity of the bare mirror substrate materials does not allow these requirements to be met. As such the IXO baseline design contains a coating layout that varies as a function of mirror radius and in accordance with the variation in grazing incidence angle. The higher energy photon response is enhanced through the use of depth-graded multilayer coatings on the inner radii mirror modules. In this paper we report on the first reflectivity measurements of wedged ribbed silicon pore optics mirror plates coated with a depth graded W/Si multilayer. The measurements demonstrate that the deposition and performance of the multilayer coatings is compatible with the SPO production process.
Original languageEnglish
JournalProceedings of SPIE--the international society for optical engineering
Volume7732
Issue number1
Pages (from-to)77323U
ISSN0277-786X
DOIs
Publication statusPublished - 2010
EventSpace Telescopes and Instrumentation : Ultraviolet to Gamma Ray - San Diego, USA
Duration: 1 Jan 2010 → …

Conference

ConferenceSpace Telescopes and Instrumentation : Ultraviolet to Gamma Ray
CitySan Diego, USA
Period01/01/2010 → …

Keywords

  • Multilayer coatings
  • Silicon pore optics

Cite this

Ackermann, M. D., Collon, M. J., Cooper-Jensen, C. P., Christensen, F. E., Krumrey, M., Cibik, L., Marggraf, S., Bavdaz, M., Lumb, D., & Shortt, B. (2010). Performance of multilayer coated silicon pore optics. Proceedings of SPIE--the international society for optical engineering, 7732(1), 77323U. https://doi.org/10.1117/12.859823