PENETRATION DEPTH OF 0.5-3-KEV ELECTRONS IN SOLID HYDROGEN AND DEUTERIUM

Jørgen Schou, H. Sørensen

    Research output: Contribution to journalJournal articleResearchpeer-review

    Abstract

    The mirror-substrate method was used for measuring the penetration depth of 0. 5-3-keV electrons in solid hydrogen and deuterium. The penetration depth was found to be 0. 53 multiplied by 10**1**8E**1**. **7**2 molecules/cm**2 with the energy given in keV. There was satisfactory agreement with other data. The measurements also showed that the escape depth for true secondary electrons from solid deuterium is less than 50 A, which agrees well with the small values for the secondary-electron-emission coefficient found for solid deuterium. Results were furthermore obtained for the electron-reflection coefficient for the gold substrate, i. e. , the number of electrons that are reflected with high energies. The electron-reflection coefficient agrees well with other results, both with respect to magnitude and energy dependence.
    Original languageEnglish
    JournalJournal of Applied Physics
    Volume49
    Issue number2
    Pages (from-to)816-821
    ISSN0021-8979
    DOIs
    Publication statusPublished - 1978

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