PD-related stresses in the bulk dielectric for ellipsoidal voids

Aage Pedersen, George C Crichton, Iain Wilson McAllister

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Abstract

In a previous study, the existence of a field enhancement in the solid dielectric in the vicinity of void undergoing PD activity was established. That study was undertaken with reference to a spherical void. In this paper, a more general investigation of this phenomenon of field enhancement is undertaken by extending the study to ellipsoidal voids
Original languageEnglish
Title of host publicationAnnual Report. of the Conference on Electrical Insulation and Dielectric Phenomena
PublisherIEEE
Publication date1994
Pages79-84
ISBN (Print)07-80-31950-8
DOIs
Publication statusPublished - 1994
EventConference on Electrical Insulation and Dielectric Phenomena 1994 - Arlington, TX, United States
Duration: 22 Oct 199425 Oct 1994
http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4605

Conference

ConferenceConference on Electrical Insulation and Dielectric Phenomena 1994
CountryUnited States
CityArlington, TX
Period22/10/199425/10/1994
Internet address

Bibliographical note

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Cite this

Pedersen, A., Crichton, G. C., & McAllister, I. W. (1994). PD-related stresses in the bulk dielectric for ellipsoidal voids. In Annual Report. of the Conference on Electrical Insulation and Dielectric Phenomena (pp. 79-84). IEEE. https://doi.org/10.1109/CEIDP.1994.591694