PD-related stresses in the bulk dielectric and their evaluation

Aage Pedersen; George C Crichton - Fratrådt; Iain Wilson McAllister

doi:10.1109/CEIDP.1993.378927

PD-related stresses in the bulk dielectric and their evaluation

Aage Pedersen
, George C Crichton - Fratrådt
, Iain Wilson McAllister

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

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Abstract

The application of electromagnetic field theory to the subject of partial discharges shows that discharging in a void generates large field distortions within the bulk dielectric in the proximity of the void. Such inherent over-stressing of a dielectric could be the effect which triggers the onset of electrical treeing and other damaging processes, and which subsequently precipitates the breakdown of the insulation. If there were a train of partial discharge events per power frequency cycle, then, during each half period, these events would lead to cumulative stress levels within the solid dielectric

Original language	English
Title of host publication	Proceedings of the Conference on Electrical Insulation and Dielectric Phenomena
Publisher	IEEE
Publication date	1993
Pages	474-480
ISBN (Print)	07-80-30966-9
DOIs	https://doi.org/10.1109/CEIDP.1993.378927
Publication status	Published - 1993
Event	Conference on Electrical Insulation and Dielectric Phenomena 1993 - Pocono Manor, PA, United States Duration: 16 Oct 1993 → 19 Oct 1993 http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=3032

Conference

Conference	Conference on Electrical Insulation and Dielectric Phenomena 1993
Country/Territory	United States
City	Pocono Manor, PA
Period	16/10/1993 → 19/10/1993
Internet address	http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=3032

Bibliographical note

Copyright: 1993 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE

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10.1109/CEIDP.1993.378927

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title = "PD-related stresses in the bulk dielectric and their evaluation",

abstract = "The application of electromagnetic field theory to the subject of partial discharges shows that discharging in a void generates large field distortions within the bulk dielectric in the proximity of the void. Such inherent over-stressing of a dielectric could be the effect which triggers the onset of electrical treeing and other damaging processes, and which subsequently precipitates the breakdown of the insulation. If there were a train of partial discharge events per power frequency cycle, then, during each half period, these events would lead to cumulative stress levels within the solid dielectric",

author = "Aage Pedersen and \{Crichton - Fratr{\aa}dt\}, \{George C\} and McAllister, \{Iain Wilson\}",

note = "Copyright: 1993 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE; Conference on Electrical Insulation and Dielectric Phenomena 1993 ; Conference date: 16-10-1993 Through 19-10-1993",

year = "1993",

doi = "10.1109/CEIDP.1993.378927",

language = "English",

isbn = "07-80-30966-9",

pages = "474--480",

booktitle = "Proceedings of the Conference on Electrical Insulation and Dielectric Phenomena",

publisher = "IEEE",

address = "United States",

url = "http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=3032",

}

Pedersen, A, Crichton - Fratrådt, GC & McAllister, IW 1993, PD-related stresses in the bulk dielectric and their evaluation. in Proceedings of the Conference on Electrical Insulation and Dielectric Phenomena. IEEE, pp. 474-480, Conference on Electrical Insulation and Dielectric Phenomena 1993, Pocono Manor, PA, United States, 16/10/1993. https://doi.org/10.1109/CEIDP.1993.378927

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T1 - PD-related stresses in the bulk dielectric and their evaluation

AU - Pedersen, Aage

AU - Crichton - Fratrådt, George C

AU - McAllister, Iain Wilson

N1 - Copyright: 1993 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE

PY - 1993

Y1 - 1993

N2 - The application of electromagnetic field theory to the subject of partial discharges shows that discharging in a void generates large field distortions within the bulk dielectric in the proximity of the void. Such inherent over-stressing of a dielectric could be the effect which triggers the onset of electrical treeing and other damaging processes, and which subsequently precipitates the breakdown of the insulation. If there were a train of partial discharge events per power frequency cycle, then, during each half period, these events would lead to cumulative stress levels within the solid dielectric

AB - The application of electromagnetic field theory to the subject of partial discharges shows that discharging in a void generates large field distortions within the bulk dielectric in the proximity of the void. Such inherent over-stressing of a dielectric could be the effect which triggers the onset of electrical treeing and other damaging processes, and which subsequently precipitates the breakdown of the insulation. If there were a train of partial discharge events per power frequency cycle, then, during each half period, these events would lead to cumulative stress levels within the solid dielectric

U2 - 10.1109/CEIDP.1993.378927

DO - 10.1109/CEIDP.1993.378927

M3 - Article in proceedings

SN - 07-80-30966-9

SP - 474

EP - 480

BT - Proceedings of the Conference on Electrical Insulation and Dielectric Phenomena

PB - IEEE

T2 - Conference on Electrical Insulation and Dielectric Phenomena 1993

Y2 - 16 October 1993 through 19 October 1993

ER -

PD-related stresses in the bulk dielectric and their evaluation

Abstract

Conference

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