PD-related stresses in the bulk dielectric and their evaluation

Aage Pedersen, George C Crichton - Fratrådt, Iain Wilson McAllister

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Abstract

The application of electromagnetic field theory to the subject of partial discharges shows that discharging in a void generates large field distortions within the bulk dielectric in the proximity of the void. Such inherent over-stressing of a dielectric could be the effect which triggers the onset of electrical treeing and other damaging processes, and which subsequently precipitates the breakdown of the insulation. If there were a train of partial discharge events per power frequency cycle, then, during each half period, these events would lead to cumulative stress levels within the solid dielectric
Original languageEnglish
Title of host publicationProceedings of the Conference on Electrical Insulation and Dielectric Phenomena
PublisherIEEE
Publication date1993
Pages474-480
ISBN (Print)07-80-30966-9
DOIs
Publication statusPublished - 1993
EventConference on Electrical Insulation and Dielectric Phenomena 1993 - Pocono Manor, PA, United States
Duration: 16 Oct 199319 Oct 1993
http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=3032

Conference

ConferenceConference on Electrical Insulation and Dielectric Phenomena 1993
CountryUnited States
CityPocono Manor, PA
Period16/10/199319/10/1993
Internet address

Bibliographical note

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