PD-related stresses in the bulk dielectric and their evaluation

Aage Pedersen, George C Crichton - Fratrådt, Iain Wilson McAllister

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    The application of electromagnetic field theory to the subject of partial discharges shows that discharging in a void generates large field distortions within the bulk dielectric in the proximity of the void. Such inherent over-stressing of a dielectric could be the effect which triggers the onset of electrical treeing and other damaging processes, and which subsequently precipitates the breakdown of the insulation. If there were a train of partial discharge events per power frequency cycle, then, during each half period, these events would lead to cumulative stress levels within the solid dielectric
    Original languageEnglish
    Title of host publicationProceedings of the Conference on Electrical Insulation and Dielectric Phenomena
    Publication date1993
    ISBN (Print)07-80-30966-9
    Publication statusPublished - 1993
    EventConference on Electrical Insulation and Dielectric Phenomena 1993 - Pocono Manor, PA, United States
    Duration: 16 Oct 199319 Oct 1993


    ConferenceConference on Electrical Insulation and Dielectric Phenomena 1993
    Country/TerritoryUnited States
    CityPocono Manor, PA
    Internet address

    Bibliographical note

    Copyright: 1993 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE


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