Abstract
Results are presented from an investigation of the relationship between changes in partial discharge patterns and the surface deterioration process taking place in small naturally formed spherical voids in epoxy plastic. The voids were exposed to a moderate electric stress above inception level, where partial discharges were present for more than 1500 h. Two types of electrical tree growth were found, the bush like tree and a single channel-like tree, which led to very different partial discharge patterns. It is concluded that the formation of crystals on a void surface leads to an immediate and easy-to-detect increase in the partial discharge activity with subsequent severe surface deterioration (deep pit formations) in the vicinity of the crystal. However, the partial discharge signal from a specimen with a black channel-like tree structure did not give any indication of channel growth
| Original language | English |
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| Journal | I E E E International Symposium on Electrical Insulation. Conference Record |
| Pages (from-to) | 115-119 |
| ISSN | 0164-2006 |
| DOIs | |
| Publication status | Published - 1990 |
| Event | 1990 IEEE International Symposium on Electrical Insulation - Toronto, Canada Duration: 3 Jun 1990 → 6 Jun 1990 |
Conference
| Conference | 1990 IEEE International Symposium on Electrical Insulation |
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| Country/Territory | Canada |
| City | Toronto |
| Period | 03/06/1990 → 06/06/1990 |