Parameter Scaling in Non-Linear Microwave Tomography

Peter Damsgaard Jensen, Tonny Rubæk, Oskar Talcoth, Johan Jacob Mohr, Neil R. Epstein

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

Abstract

Non-linear microwave tomographic imaging of the breast is a challenging computational problem. The breast is heterogeneous and contains several high-contrast and lossy regions, resulting in large differences in the measured signal levels. This implies that special care must be taken when the imaging problem is formulated. Under such conditions, microwave imaging systems will most often be considerably more sensitive to changes in the electromagnetic properties in certain regions of the breast. The result is that the parameters might not be reconstructed correctly in the less sensitive regions. In this paper, a method for obtaining a more uniform sensitivity throughout the breast is investigated. The method for obtaining uniform sensitivity throughout the imaging domain is a scaling of the parameters to be reconstructed. This scaling, based on the norms of the columns of the Jacobian, is also introduced as a measure of the sensitivity. The scaling of the parameters is shown to improve performance of the microwave imaging system when applied to reconstruction of images from 2-D simulated data and measurement data.
Original languageEnglish
Title of host publication2012 Loughborough Antennas & Propagation Conference
Number of pages5
PublisherIEEE
Publication date2012
ISBN (Print)978-1-4673-2220-1
Publication statusPublished - 2012
Event2012 Loughborough Antennas & Propagation Conference - Loughborough, United Kingdom
Duration: 12 Nov 201213 Nov 2012

Conference

Conference2012 Loughborough Antennas & Propagation Conference
CountryUnited Kingdom
CityLoughborough
Period12/11/201213/11/2012

Cite this

Jensen, P. D., Rubæk, T., Talcoth, O., Mohr, J. J., & Epstein, N. R. (2012). Parameter Scaling in Non-Linear Microwave Tomography. In 2012 Loughborough Antennas & Propagation Conference IEEE.