Abstract
The resolution problem in X-ray energy-dispersive diffractometry is discussed. It is shown that for a given characteristic of the solid-state detector system and a given range of interplanar spacings, an optimum scattering angle can be easily found for any divergence of the incident and scattered beams.
| Original language | English |
|---|---|
| Journal | Journal of Applied Crystallography |
| Volume | 11 |
| Issue number | April |
| Pages (from-to) | 137-140 |
| ISSN | 0021-8898 |
| DOIs | |
| Publication status | Published - 1978 |